DocumentCode :
3371426
Title :
A wide-locking range SiGe BiCMOS divide-by-3 injection locked oscillators
Author :
Jang, Sheng-Lyang ; Chang, Chia-Wei ; Cheng, Ching-Lun ; Hsue, Ching-Wen ; Hsu, Chun-Wei
Author_Institution :
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear :
2011
fDate :
25-28 April 2011
Firstpage :
1
Lastpage :
4
Abstract :
An active inductor oscillator-based divide-by-3 injection locked frequency divider (ILFD) is proposed, and was implemented in the 0.35 μm SiGe 3P3M BiCMOS technology. Measurement results show that when the supply voltage Vdd is biased at 3.0 V, the free-running oscillation frequency of the ILFD is tunable from 3.84 GHz to 3.13 GHz, and at the incident power of 0 dBm and the Vtune = 2.5 V, the locking range is about 1.67 GHz, from the incident frequency 10.24 GHz to 11.91 GHz. The core power consumption is 4.32 mW at Vdd = 3.0 V.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; frequency dividers; injection locked oscillators; microwave integrated circuits; microwave oscillators; 3P3M BiCMOS technology; SiGe; active inductor oscillator; divide-by-3 injection locked oscillators; frequency 10.24 GHz to 11.91 GHz; frequency 3.84 GHz to 3.13 GHz; injection locked frequency divider; power 4.32 mW; size 0.35 mum; voltage 2.5 V; voltage 3 V; wide-locking range BiCMOS; BiCMOS integrated circuits; Frequency conversion; Frequency measurement; Heterojunction bipolar transistors; Phase noise; Sensitivity; Silicon germanium; SiGe HBT BiCMOS; active-inductor; divide-by-3 injection-locked frequency divider; locking range;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on
Conference_Location :
Hsinchu
ISSN :
Pending
Print_ISBN :
978-1-4244-8500-0
Type :
conf
DOI :
10.1109/VDAT.2011.5783549
Filename :
5783549
Link To Document :
بازگشت