DocumentCode
3371452
Title
Real-time depth diffusion for 3D surface reconstruction
Author
Varadarajan, Karthik Mahesh ; Vincze, Markus
Author_Institution
Vision for Robot., Autom. & Control Inst., Tech. Univ. Wien, Vienna, Austria
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
4149
Lastpage
4152
Abstract
Range data obtained from conventional stereo-cameras employing dense stereo matching algorithms typically contain a high amount of noise, especially under poor illumination conditions. Furthermore, lack of reliable depth estimates in low-texture regions can result in poor 3D surface reconstruction. Anisotropic diffusion algorithms have been used recently in stereo matching, depth estimation and 3D surface reconstruction. However, these algorithms typically have long execution times, preventing real-time operation on resource constrained systems and robots. Moreover, most of these techniques suffer from excessive smoothing at depth discontinuities resulting in loss of structure, especially in areas where the 2D image does not provide structural cues to guide the depth diffusion. These algorithms are also unsuitable for diffusion of extremely sparse depth data such as in the case of homogenous surfaces. This paper addresses these issues by novel denoising and diffusion techniques. The results presented demonstrate the run-time efficiency and fidelity of reconstructed depth surfaces.
Keywords
image denoising; image matching; image reconstruction; smoothing methods; stereo image processing; 3D surface reconstruction; anisotropic diffusion algorithm; denoising technique; dense stereo matching algorithm; depth estimation; depth surface reconstruction; diffusion technique; excessive smoothing; real-time depth diffusion; resource constrained system; robot; stereo-cameras; Equations; Estimation; Filtering; Image reconstruction; Pixel; Surface morphology; Surface reconstruction; Depth; anisotropic diffusion; dense stereo; multi-grid; real-time;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5653845
Filename
5653845
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