• DocumentCode
    3371575
  • Title

    A family of novel surge protection devices with improved parameter control

  • Author

    Walsh, P.R. ; Murray, A.F.J. ; Lane, W.A.

  • Author_Institution
    Univ. Coll. Cork, Ireland
  • fYear
    1998
  • fDate
    3-6 Jun 1998
  • Firstpage
    301
  • Lastpage
    304
  • Abstract
    A novel breakover diode (BOD) structure for overvoltage protection applications is proposed. The structure incorporates a surface breakdown trigger mechanism (SBTM), which facilitates the generation of a range of triggering voltages, independent of the starting material´s resistivity and by modification of only a single process step. Significant reduction in the tolerance of the triggering voltage (VBF) has also been achieved. The switching point´s dependence on the forward breakdown voltage has virtually been eliminated and independent control of the breakover current (IBO) is available. Prototype devices exhibit narrow breakover voltage (VBO) windows and significantly reduced leakage current (IL) ratings. Experimental results are in good agreement with simulated trends
  • Keywords
    electric breakdown; electrical resistivity; overvoltage protection; power semiconductor diodes; semiconductor device testing; surge protection; breakover current; breakover diode structure; breakover voltage; forward breakdown voltage; leakage current rating; overvoltage protection; parameter control; starting material resistivity; surface breakdown trigger mechanism; surge protection devices; switching point; triggering voltage generation; triggering voltage tolerance; Board of Directors; Breakdown voltage; Cathodes; Conductivity; Diodes; Educational institutions; Electric breakdown; Surge protection; Telecommunication control; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
  • Conference_Location
    Kyoto
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-4752-8
  • Type

    conf

  • DOI
    10.1109/ISPSD.1998.702693
  • Filename
    702693