DocumentCode
3371684
Title
Efficient state space exploration: Interleaving stateless and state-based model checking
Author
Ganai, Malay K. ; Wang, Chao ; Li, Weihong
fYear
2010
fDate
7-11 Nov. 2010
Firstpage
786
Lastpage
793
Abstract
State-based model checking methods comprise computing and storing reachable states, while stateless model checking methods directly reason about reachable paths using decision procedures, thereby avoiding computing and storing the reachable states. Typically, state-based methods involve memory-intensive operations, while stateless methods involve time-intensive operations. We propose a divide-and-conquer strategy to combine the complementary strengths of these methods for efficient verification of embedded software. Specifically, our model checking engine uses both state decomposition and state prioritization to guide the combination of a Presburger arithmetic based symbolic traversal algorithm (state-based) and an SMT based bounded model checking algorithm (stateless). These two underlying algorithms are interleaved-based on memory/time bounds and dynamic task partitioning-in order to systematically explore the state space and to avoid storing the entire reachable state set. We have implemented our new method in a tightly integrated verification tool called HMC (Hybrid Model Checker). We demonstrate the efficacy of the proposed method on some industry examples.
Keywords
electronic engineering computing; integrated circuit modelling; state-space methods; Hybrid Model Checker; Presburger arithmetic; bounded model checking algorithm; divide-and-conquer strategy; integrated verification tool; model checking engine; satisfiability module theory; state based model checking; state decomposition; state prioritization; state space exploration; stateless model checking; symbolic traversal algorithm; Bismuth; Cognition; Computational modeling; Embedded software; Heuristic algorithms; Space exploration; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-8193-4
Type
conf
DOI
10.1109/ICCAD.2010.5653863
Filename
5653863
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