• DocumentCode
    3371703
  • Title

    Modeling multi-output filtering effects in PCMOS

  • Author

    Singh, Anshul ; Basu, Arindam ; Ling, Keck-Voon ; Mooney, Vincent J., III

  • Author_Institution
    Int. Inst. of Inf. Technol., Hyderabad, India
  • fYear
    2011
  • fDate
    25-28 April 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A methodology has been proposed recently to predict error rates of cascade structures of blocks in Probabilistic CMOS (PCMOS). It requires characterization of unique probabilistic blocks to predict the error rates of a multi-block cascade structure. While the technique was shown to work for a probabilistic carry-select adder, the technique needs a new model to work in a Wallace Tree Multiplier (WTM) where error propagates not only along the carry bit but also along the sum bit of the basic full adder building block utilized. In this paper we present a new model for characterization of probabilistic circuits/blocks and present a procedure to find and characterize unique circuits/blocks. Unlike prior approaches, our new model distinguishes distinct filtering effects per output. We apply the proposed model to a WTM and show that using our model, the methodology using a cascade structure can predict WTM error-rates with reasonable accuracy in PCMOS.
  • Keywords
    CMOS integrated circuits; cascade networks; PCMOS; Wallace tree multiplier; multi-block cascade structure; multi-output filtering; probabilistic CMOS; probabilistic blocks; Error analysis; Filtering; Integrated circuit modeling; Mathematical model; Noise; Predictive models; Probabilistic logic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-8500-0
  • Type

    conf

  • DOI
    10.1109/VDAT.2011.5783561
  • Filename
    5783561