Title :
Technology scaling: A system perspective
Abstract :
A collection of slides from the author´s conference presentation is given. The following topics are discussed: VLSI design, automation & test; technology scaling; Moore´s law; platform segment characteristics; dynamic platform control; dynamic adaptation & reconfiguration; resilient platforms; voltage-frequency range limiters; voltage-frequency margins; fine-grain power management; voltage regulators; reconfigurable accelerators; platform interconnects; energy efficient interconnects; many-core research testchip; many-core power management; variation-aware core-mapping; core-to-core variations; optimal core-mapping; dynamic thread-hopping; dynamic multi-voltage cache; cache reconfiguration; low-voltage motion estimation engine; dynamic V&F adaptation; resilient circuits; resilient & adaptive core; performance & efficiency gains; and adaptive clock control.
Keywords :
VLSI; cache storage; electronic engineering computing; integrated circuit technology; integrated circuit testing; microprocessor chips; multi-threading; reconfigurable architectures; voltage regulators; Moore´s law; VLSI automation; VLSI design; VLSI test; adaptive clock control; adaptive core; cache reconfiguration; core-to-core variations; dynamic V&F adaptation; dynamic adaptation & reconfiguration; dynamic multivoltage cache; dynamic platform control; dynamic thread-hopping; efficiency gain; energy efficient interconnects; fine-grain power management; low-voltage motion estimation engine; many-core power management; many-core research testchip; optimal core-mapping; performance gain; platform interconnects; platform segment characteristics; reconfigurable accelerators; resilient circuits; resilient core; resilient platforms; system perspective; technology scaling; variation-aware core-mapping; voltage regulators; voltage-frequency margins; voltage-frequency range limiters;
Conference_Titel :
VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-8500-0
DOI :
10.1109/VDAT.2011.5783568
