• DocumentCode
    3371860
  • Title

    Simulation of Current Filaments in Photoconductive Semiconductor Switches

  • Author

    Kambour, K. ; Hjalmarson, H.P. ; Zutavern, F.J. ; Mar, A. ; Myles, Charles W. ; Joshi, R.P.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM
  • fYear
    2005
  • fDate
    13-17 June 2005
  • Firstpage
    814
  • Lastpage
    817
  • Abstract
    Photoconductive semiconductor switches (PCSS´s), such as optically-triggered GaAs switches, have been developed for a variety of applications. Such switches exhibit unique properties as a consequence of lock-on, a phenomenon associated with the bistable switching of these devices. In this paper, lock-on is explained in terms of collective impact ionization. Furthermore, the effect of defects on the performance of these devices is investigated.
  • Keywords
    photoconducting switches; semiconductor switches; GaAs; bistable switching; collective impact ionization; current filaments; photoconductive semiconductor switches; Charge carrier density; Distribution functions; Electrodes; Electrons; Impact ionization; Optical bistability; Optical switches; Photoconducting devices; Power semiconductor switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2005 IEEE
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-9189-6
  • Electronic_ISBN
    0-7803-9190-x
  • Type

    conf

  • DOI
    10.1109/PPC.2005.300786
  • Filename
    4084342