DocumentCode :
3371969
Title :
Formal deadlock checking on high-level SystemC designs
Author :
Chun-Nan Chou ; Chang-Hong Hsu ; Yueh-Tung Chao ; Chung-Yang Huang
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2010
fDate :
7-11 Nov. 2010
Firstpage :
794
Lastpage :
799
Abstract :
One of the main purposes to use SystemC in system development is to perform system-level verification in the early design stage. However, simulation is still by far the only available solution for the high-level SystemC design verification. Nonetheless, traditional formal verification techniques, which rely on the translation of designs under verification to logic netlists, cannot be easily adopted here due to the concurrent/asynchronous nature and the abundant synthesis flexibilities of the high-level designs. In this paper, we propose a multi-layer modeling to represent the highlevel SystemC designs. By representing the different aspects of the design with different structures - simulation kernel, predictive synchronization dependence graph (PSDG), and extended Petri net (extPN), our modeling can be very concise and faithfully capture the original design semantics. We develop a formal verification engine on this modeling for the deadlock checks. With various novel ideas to enable the symbolic simulation, bounded model checking (BMC) and invariant checking techniques to work on high-level, our experimental results demonstrate the robustness and effectiveness of the formal deadlock checking on high-level SystemC designs.
Keywords :
Petri nets; electronic engineering computing; formal verification; graph theory; high level synthesis; bounded model checking; extended Petri net; formal deadlock checking; formal verification engine; high level SystemC designs; invariant checking technique; multilayer modeling; predictive synchronization dependence graph; simulation kernel; symbolic simulation; system level verification; Analytical models; Computational modeling; Data models; Engines; Kernel; Synchronization; System recovery;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-8193-4
Type :
conf
DOI :
10.1109/ICCAD.2010.5653880
Filename :
5653880
Link To Document :
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