DocumentCode
3371969
Title
Formal deadlock checking on high-level SystemC designs
Author
Chun-Nan Chou ; Chang-Hong Hsu ; Yueh-Tung Chao ; Chung-Yang Huang
Author_Institution
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2010
fDate
7-11 Nov. 2010
Firstpage
794
Lastpage
799
Abstract
One of the main purposes to use SystemC in system development is to perform system-level verification in the early design stage. However, simulation is still by far the only available solution for the high-level SystemC design verification. Nonetheless, traditional formal verification techniques, which rely on the translation of designs under verification to logic netlists, cannot be easily adopted here due to the concurrent/asynchronous nature and the abundant synthesis flexibilities of the high-level designs. In this paper, we propose a multi-layer modeling to represent the highlevel SystemC designs. By representing the different aspects of the design with different structures - simulation kernel, predictive synchronization dependence graph (PSDG), and extended Petri net (extPN), our modeling can be very concise and faithfully capture the original design semantics. We develop a formal verification engine on this modeling for the deadlock checks. With various novel ideas to enable the symbolic simulation, bounded model checking (BMC) and invariant checking techniques to work on high-level, our experimental results demonstrate the robustness and effectiveness of the formal deadlock checking on high-level SystemC designs.
Keywords
Petri nets; electronic engineering computing; formal verification; graph theory; high level synthesis; bounded model checking; extended Petri net; formal deadlock checking; formal verification engine; high level SystemC designs; invariant checking technique; multilayer modeling; predictive synchronization dependence graph; simulation kernel; symbolic simulation; system level verification; Analytical models; Computational modeling; Data models; Engines; Kernel; Synchronization; System recovery;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-8193-4
Type
conf
DOI
10.1109/ICCAD.2010.5653880
Filename
5653880
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