• DocumentCode
    3372179
  • Title

    Least leakage vector assisted technology mapping for total power optimization

  • Author

    Au, Yi-Ching ; Tsui, Chi-ying

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., China
  • Volume
    5
  • fYear
    2004
  • fDate
    23-26 May 2004
  • Abstract
    As the feature size continues to shrink and the threshold voltage keeps on reducing, leakage power becomes a significant component of the total power consumption. The cost function used in the conventional logic synthesis tools was over simplified in modelling the total power consumption of the logic network. On the other hand, recent works on reducing leakage power mainly focused on an already synthesized network. We propose a complete model of the total power consumption of the logic network which includes the leakage power and also takes into account the operating duty cycle of the applications. In addition, we propose a least leakage vector (LLV) assisted technology mapping to optimize the total power of the final mapped network. The LLV used during technology mapping phase is obtained from the technology decomposed network. Experimental results show that an average of 20% reduction in total power consumption is obtained comparing with the conventional low power technology mapping algorithm.
  • Keywords
    circuit optimisation; logic design; logic testing; low-power electronics; leakage power; least leakage vector assisted technology mapping; logic network; logic synthesis tools; low power technology mapping algorithm; operating duty cycle; synthesized network; threshold voltage; total power consumption; total power optimization; Circuit synthesis; Cost function; Energy consumption; Gold; Leakage current; Logic circuits; Network synthesis; Power engineering and energy; Switching circuits; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
  • Print_ISBN
    0-7803-8251-X
  • Type

    conf

  • DOI
    10.1109/ISCAS.2004.1329483
  • Filename
    1329483