DocumentCode
3372229
Title
An industry-driven laboratory development for mixed-signal IC test education
Author
Hu, John ; Haffner, Mark ; Yoder, Samantha ; Reehal, Gursharan ; Scott, Mark ; Ismail, Mohammed
Author_Institution
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fYear
2010
fDate
May 30 2010-June 2 2010
Firstpage
85
Lastpage
88
Abstract
This paper describes a new course on mixed-signal IC test engineering, jointly established by the Department of Electrical and Computer Engineering (ECE) of The Ohio State University and Texas Instruments. The course is motivated by the lack of qualified test engineers in industry and the absence of this education at the collegiate level. The course objective is to help student obtain the fundamental skills required for a mixed-signal IC test engineer. The course structure and laboratory developments are covered in details. Students feedbacks based on anonymous survey indicate that the goals are well met.
Keywords
electronic engineering education; mixed analogue-digital integrated circuits; industry-driven laboratory development; mixed-signal IC test education; mixed-signal IC test engineering; Analog integrated circuits; Circuit testing; Computer science education; Design engineering; Electrical engineering; Industrial training; Instruments; Integrated circuit testing; Laboratories; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-5308-5
Electronic_ISBN
978-1-4244-5309-2
Type
conf
DOI
10.1109/ISCAS.2010.5537028
Filename
5537028
Link To Document