• DocumentCode
    3372229
  • Title

    An industry-driven laboratory development for mixed-signal IC test education

  • Author

    Hu, John ; Haffner, Mark ; Yoder, Samantha ; Reehal, Gursharan ; Scott, Mark ; Ismail, Mohammed

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    85
  • Lastpage
    88
  • Abstract
    This paper describes a new course on mixed-signal IC test engineering, jointly established by the Department of Electrical and Computer Engineering (ECE) of The Ohio State University and Texas Instruments. The course is motivated by the lack of qualified test engineers in industry and the absence of this education at the collegiate level. The course objective is to help student obtain the fundamental skills required for a mixed-signal IC test engineer. The course structure and laboratory developments are covered in details. Students feedbacks based on anonymous survey indicate that the goals are well met.
  • Keywords
    electronic engineering education; mixed analogue-digital integrated circuits; industry-driven laboratory development; mixed-signal IC test education; mixed-signal IC test engineering; Analog integrated circuits; Circuit testing; Computer science education; Design engineering; Electrical engineering; Industrial training; Instruments; Integrated circuit testing; Laboratories; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537028
  • Filename
    5537028