DocumentCode
3372373
Title
A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor
Author
Wittpahl, V. ; Liu, W. ; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. ; Balk, L.J. ; Yan, K.P.
Author_Institution
Centre for Integrated Circuit Failure Anal. & Reliability, Nat. Univ. of Singapore, Singapore
fYear
1996
fDate
April 30 1996-May 2 1996
Firstpage
188
Lastpage
194
Abstract
A degradation monitor that allows the prediction of the light output degradation of light emitting diodes is described. This is based on the variation of the differential cathodoluminescence signal output to distinguish between "good" and "bad" devices. A corresponding method using the variation of the junction ideality factor during stressing is also described.
Keywords
cathodoluminescence; light emitting diodes; semiconductor device reliability; LEDs; degradation monitor; differential cathodoluminescence signal output; junction ideality factor; light output degradation; stressing; Condition monitoring; Degradation; Failure analysis; Light emitting diodes; Optical fiber communication; Optoelectronic devices; Radiative recombination; Scanning electron microscopy; Semiconductor devices; Spontaneous emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-2753-5
Type
conf
DOI
10.1109/RELPHY.1996.492080
Filename
492080
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