Title :
IEEE Instrumentation and Measurement Technology Conference
Abstract :
The following topics are dealt with: analog-to-digital converters; system-level-integration technology; dielectric properties of materials; environmental monitoring; medical measurements; medical instrumentation; built-in test; self-test; electromagnetic measurements; instrumentation and sensors for farming; system-on-chip integrated circuits; RF and microwave moisture sensing applications; data acquisition; data measurements; signal processing; sigma-delta modulators; VLSI; power measurements; position measurements; biologically inspired instrumentation; system identification; spectroscopy; low frequency measurements; optical transducers; power quality; imaging systems and techniques; optical sensors; system health measurement; virtual labs for education in instrumentation and measurement; perception and modeling of 3D objects and scenes; medical applications; sensor arrays; temperature measurement; ground transportation systems; virtual environments; computer networks measurements; measurement uncertainty; sensor networks; soft computing; intelligent robotics; optical instrumentation; optical measurement; multi-sensor systems; model-based sensor systems; and FSM testing and instrumentation
Keywords :
VLSI; analogue-digital conversion; biomedical measurement; built-in self test; computer networks; data acquisition; dielectric properties; measurement uncertainty; optical sensors; position measurement; power measurement; signal processing; system-on-chip; temperature measurement; FSM instrumentation; FSM testing; RF sensing applications; VLSI; analog-to-digital converters; biologically inspired instrumentation; built-in test; computer networks measurements; data acquisition; data measurements; dielectric properties; electromagnetic measurements; environmental monitoring; ground transportation systems; imaging systems; intelligent robotics; measurement uncertainty; medical instrumentation; medical measurements; microwave moisture sensing applications; model-based sensor systems; multisensor systems; optical instrumentation; optical measurement; optical sensors; optical transducers; position measurements; power measurements; power quality; self-test; sensor arrays; sensor networks; sigma-delta modulators; signal processing; soft computing; spectroscopy; system health measurement; system identification; system-level-integration technology; system-on-chip integrated circuits; temperature measurement; virtual environments; virtual laboratory;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604044
