• DocumentCode
    3372452
  • Title

    High performance DDR architecture in Intel® Core™ processors using 32nm CMOS high-K metal-gate process

  • Author

    Mosalikanti, Praveen ; Mozak, Chris ; Kurd, Nasser

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    2011
  • fDate
    25-28 April 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper describes the DDR architecture in Intel® Core™ processors operating up to 1333MT/s and designed in 32nm process technology. The architecture uses adaptive techniques to achieve very low clock jitter (40% margin to spec), data scrambling to reduce simultaneous switching noise and novel training algorithms to improve I/O margins in the presence of crosstalk. A fast wakeup technique allows shutting down the receive path for finer grain power management, reducing standby power by 15%.
  • Keywords
    CMOS digital integrated circuits; microprocessor chips; phase locked loops; CMOS high-K metal-gate process; I/O margin improvement; Intel core processor; PLL; clock jitter; grain power management; high performance DDR architecture; size 32 nm; switching noise; training algorithm; Clocks; Crosstalk; Delay; Logic gates; Noise; Phase locked loops; Quantum cascade lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    Pending
  • Print_ISBN
    978-1-4244-8500-0
  • Type

    conf

  • DOI
    10.1109/VDAT.2011.5783599
  • Filename
    5783599