DocumentCode
3372466
Title
Foreword
fYear
2008
fDate
April 27 2008-May 1 2008
Abstract
Presents the introductory welcome message from the conference proceedings.
Keywords
CMOS analog integrated circuits; CMOS memory circuits; Circuit testing; Conferences; Educational programs; Fault diagnosis; Radio frequency; Semiconductor device testing; System testing; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.4
Filename
4511679
Link To Document