Title :
Simulation of shielding characteristic of a typical decay waveguide window for EMP
Author :
Fang, Chonghua ; Zhang, Qi ; Xie, Dagang
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on EMC, China Ship Dev. & Design Center, Wuhan, China
Abstract :
This work simulates the shielding characteristic of a typical decay waveguide window for EMP. In the past, most researchers on electromagnetic protection have mainly focused their attention on the aperture coupling on the rectangular cavity. In contrast, the focus of this paper is not on it, but rather on the shielding characteristic of a typical decay waveguide window for EMP. The effect on EM coupling and shielding due to penetration through apertures behind it is also investigated. Here, the popular double exponential pulse has been used in the simulation of incident EMP. Full wave method of finite integration has been employed for the field strength at different points behind the window decay waveguide window. In addition, field nephograms are obtained for showing the whole shielding characteristic. Finally, the simulated results are verified with test data.
Keywords :
electromagnetic pulse; electromagnetic shielding; EMP; aperture coupling; decay waveguide window; double exponential pulse; electromagnetic protection; field nephograms; finite integration; full wave method; rectangular cavity; shielding characteristics; Apertures; Couplings; Electric fields; Electromagnetic waveguides; Geometry; Magnetic fields;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-7366-3
DOI :
10.1109/ICEAA.2010.5653909