DocumentCode
3372566
Title
Test Technology Technical Council (TTTC)
fYear
2008
fDate
April 27 2008-May 1 2008
Abstract
Provides a listing of current committee members and society officers.
Keywords
Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.87
Filename
4511685
Link To Document