DocumentCode :
3372603
Title :
Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems
Author :
Dou, Qingqi ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX
fYear :
2008
fDate :
April 27 2008-May 1 2008
Firstpage :
3
Lastpage :
8
Abstract :
Time interleaved A/D converters (TIADCs) provide an attractive solution to the realization of analog front ends in high speed communication systems. However, gain mismatch, offset mismatch, and sampling time mismatch between time-interleaved channels limit the performance of TIADCs. This paper presents a low-cost test scheme to measure timing mismatch using an undersampling clock. Our method is applicable to an arbitrary number of channels, achieving picosecond resolution with low power consumption. Both simulation and hardware measurements are presented to validate the proposed technique.
Keywords :
analogue circuits; analogue-digital conversion; clocks; low-power electronics; telecommunication channels; timing; analog front ends; gain mismatch; high speed communication system; high-speed communication systems; low power consumption; low-cost test; offset mismatch; picosecond resolution; power consumption; sampling time mismatch; time interleaved A/D converter; time-interleaved A/D converters; time-interleaved channels; timing mismatch; undersampling clock; Analog computers; Analog-digital conversion; Clocks; Degradation; Energy consumption; Frequency; Physical layer; Sampling methods; System testing; Timing; High speed testing; Low-cost test; Mixed-signal testing; Time-Interleaved ADC; Timing Mismatch;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3123-6
Type :
conf
DOI :
10.1109/VTS.2008.57
Filename :
4511688
Link To Document :
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