Measurement and characterization of ultra-wideband wireless interconnects within active computing systems

Author

Woracheewan, Sirikarn ; Hu, Changhui ; Khanna, Rahul ; Nejedlo, Jay ; Liu, Huaping ; Chiang, Patrick

Author_Institution

Sch. of EECS, Oregon State Univ., Corvallis, OR, USA

fYear

2011

fDate

25-28 April 2011

Firstpage

1

Lastpage

4

Abstract

This paper presents experimental measurements of ultra-wideband (UWB) wireless interconnects within an operational computer system chassis. Using an impulse-radio ultra-wideband (IR-UWB) 3-5GHz transceiver, this paper analyzes and verifies the implementation of high-bandwidth wireless communications within an enclosed, heavy multipath, metallic environment such as a computer server chassis. Bit-error-rate (BER) and recovered clock jitter were measured at various positions within the computer chassis. The results show a 6X improvement in BER after applying the equalizer to the noisy channel while the motherboard is fully operating.

Keywords

equalisers; error statistics; integrated circuit interconnections; jitter; multipath channels; radio transceivers; radiocommunication; ultra wideband communication; BER; IR-UWB transceiver; UWB wireless interconnects; active computing systems; bit-error-rate; computer chassis; computer server chassis; equalizer; heavy multipath; high-bandwidth wireless communications; impulse-radio ultra-wideband transceiver; metallic environment; motherboard; noisy channel; operational computer system chassis; recovered clock jitter; ultra-wideband wireless interconnects; Antenna measurements; Bit error rate; Clocks; Computers; Electromagnetic interference; Transceivers; Wireless communication; Bit-error-rate; Clock jitter; Computer chassis; Electromagnetic interference; Equalizer; Impulse-radio ultra-wideband; Inter-symbol interference; Transceiver; Wireless interconnects;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Design, Automation and Test (VLSI-DAT), 2011 International Symposium on

Conference_Location

Hsinchu

ISSN

Pending

Print_ISBN

978-1-4244-8500-0

Type

conf

DOI

10.1109/VDAT.2011.5783606

Filename

5783606