DocumentCode
3372728
Title
MUMCUT: a fault-based strategy for testing Boolean specifications
Author
Chen, T.Y. ; Lau, M.E. ; Yu, Y.T.
Author_Institution
Dept. of Comput. & Math., Hong Kong Inst. of Vocational Educ., Hong Kong
fYear
1999
fDate
1999
Firstpage
606
Lastpage
613
Abstract
We study the MUMCUT strategy that integrates the MUTP, MNFP and CUTPNFP strategies previously proposed separately for testing Boolean specifications. The MUMCUT strategy guarantees to detect seven types of faults found in Boolean expressions. We describe an implementation of generating test sets that satisfy the MUMCUT strategy, and empirically evaluate its cost effectiveness. With respect to a previously published set of Boolean expressions derived from a real specification, we find that on average the MUMCUT strategy requires only about one quarter the size of an exhaustive test set. Moreover, the MUMCUT strategy proves to be a substantial improvement to the MAX-A and MAX-B strategies which detect the same types of faults
Keywords
Boolean algebra; formal specification; program testing; Boolean expressions; Boolean specification testing; CUTPNFP strategy; MAX-A; MAX-B; MNFP; MUMCUT strategy; MUTP; cost effectiveness; exhaustive test set; fault based strategy; real specification; test sets; Boolean functions; Circuit faults; Circuit testing; Computer science; Computer science education; Continuing education; Electronic equipment testing; Fault detection; Mathematics; Software engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering Conference, 1999. (APSEC '99) Proceedings. Sixth Asia Pacific
Conference_Location
Takamatsu
Print_ISBN
0-7695-0509-0
Type
conf
DOI
10.1109/APSEC.1999.809656
Filename
809656
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