Title :
MUMCUT: a fault-based strategy for testing Boolean specifications
Author :
Chen, T.Y. ; Lau, M.E. ; Yu, Y.T.
Author_Institution :
Dept. of Comput. & Math., Hong Kong Inst. of Vocational Educ., Hong Kong
Abstract :
We study the MUMCUT strategy that integrates the MUTP, MNFP and CUTPNFP strategies previously proposed separately for testing Boolean specifications. The MUMCUT strategy guarantees to detect seven types of faults found in Boolean expressions. We describe an implementation of generating test sets that satisfy the MUMCUT strategy, and empirically evaluate its cost effectiveness. With respect to a previously published set of Boolean expressions derived from a real specification, we find that on average the MUMCUT strategy requires only about one quarter the size of an exhaustive test set. Moreover, the MUMCUT strategy proves to be a substantial improvement to the MAX-A and MAX-B strategies which detect the same types of faults
Keywords :
Boolean algebra; formal specification; program testing; Boolean expressions; Boolean specification testing; CUTPNFP strategy; MAX-A; MAX-B; MNFP; MUMCUT strategy; MUTP; cost effectiveness; exhaustive test set; fault based strategy; real specification; test sets; Boolean functions; Circuit faults; Circuit testing; Computer science; Computer science education; Continuing education; Electronic equipment testing; Fault detection; Mathematics; Software engineering;
Conference_Titel :
Software Engineering Conference, 1999. (APSEC '99) Proceedings. Sixth Asia Pacific
Conference_Location :
Takamatsu
Print_ISBN :
0-7695-0509-0
DOI :
10.1109/APSEC.1999.809656