DocumentCode :
3372820
Title :
IP Session 2C: Device Degradation and Infant Mortality
fYear :
2008
fDate :
April 27 2008-May 1 2008
Firstpage :
85
Lastpage :
85
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3123-6
Type :
conf
DOI :
10.1109/VTS.2008.66
Filename :
4511701
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3372820
