Title :
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories
Author :
Harutunyan, G. ; Vardanian, V.A. ; Zorian, Y.
Author_Institution :
Virage Logic, Yerevan
fDate :
April 27 2008-May 1 2008
Abstract :
Previously, a minimal algorithm of length 70 N, N is the number of memory bits, was proposed for a subclass of dynamic faults. In this paper, a March-based fault location and full diagnosis algorithm of complexity 88 N+29 is proposed for the same subclass of dynamic faults in bit-oriented SRAMs.
Keywords :
fault diagnosis; random-access storage; March-based three-phase fault location; memory bits; random access memories; two-operation dynamic faults; Fault detection; Fault diagnosis; Fault location; Logic testing; Phase detection; Random access memory; Redundancy; SPICE; System-on-a-chip; Very large scale integration; detection; diagnosis; fault; localization; march test;
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-0-7695-3123-6
DOI :
10.1109/VTS.2008.33
