DocumentCode :
3373103
Title :
A Time-Domain Method for Pseudo-Spectral Characterization
Author :
Mishra, Apurva ; Soma, Mani
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA
fYear :
2008
fDate :
April 27 2008-May 1 2008
Firstpage :
163
Lastpage :
168
Abstract :
We present a generic method for determining transfer function of a DUT using simple time-domain computations in place of conventional computationally intensive frequency domain methods. Our method uses a chirp stimulus and an average of absolute value to extract energy in different frequency bins. For an No-size spectrum, this enables a reduction of computational complexity from No In No multiply-accumulates (using an FFT) to No accumulates. This makes it an attractive strategy for BIST. We present the theoretical basis, test case simulations, and a comparison with the FFT method.
Keywords :
mixed analogue-digital integrated circuits; time-domain analysis; FFT method; chirp stimulus; pseudo-spectral characterization; time-domain method; transfer function; Built-in self-test; Circuit faults; Circuit testing; Computational complexity; Computational modeling; Frequency domain analysis; Radio frequency; Spectral analysis; Time domain analysis; Transfer functions; analog test; bist; fft; mixed-signal test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
ISSN :
1093-0167
Print_ISBN :
978-0-7695-3123-6
Type :
conf
DOI :
10.1109/VTS.2008.50
Filename :
4511716
Link To Document :
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