Reliability tests and failure analysis for quality improvement in 1.5 /spl mu/m Fabry-Perot lasers

Author

Montanger, Paolo ; Azzini, Giuseppe A. ; Crovato, Rosella ; Ricci, Luca ; Serra, Laura

Author_Institution

CSELT, Torino, Italy

fYear

1996

fDate

April 30 1996-May 2 1996

Firstpage

199

Lastpage

202

Abstract

The quality of 1.5 /spl mu/m Fabry-Perot lasers for application in the optical access network has been improved by lifetests and failure analysis on two groups of buried structure (buried mushroom-BMS and buried ridge-BRS) devices. The comparison between the degradation levels and the failure mechanisms (interface defects, leakage paths) suggested the choice of the less weak BRS structure and the technological improvements to be applied. A new group of BRS devices showed less defectivity and good stability during the lifetest.

Keywords

Fabry-Perot resonators; failure analysis; laser reliability; leakage currents; life testing; optical communication equipment; optical fibre networks; semiconductor lasers; 1.5 micrometre; Fabry-Perot lasers; buried mushroom; buried ridge; defectivity; degradation levels; failure analysis; failure mechanisms; interface defects; leakage paths; optical access network; reliability tests; Aging; Chemical lasers; Costs; Degradation; Fabry-Perot; Failure analysis; Laser tuning; Optical devices; Performance evaluation; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International

Conference_Location

Dallas, TX, USA

Print_ISBN

0-7803-2753-5

Type

conf

DOI

10.1109/RELPHY.1996.492119

Filename

492119