DocumentCode :
3373273
Title :
System-level applications of model-based diagnostic reasoning
Author :
Marcott, Richard A. ; Neiberg, Maurine J. ; Schoen, Joel M.
Author_Institution :
Mitre Corp., Bedford, MA, USA
fYear :
1992
fDate :
1992
Firstpage :
123
Lastpage :
130
Abstract :
Progress in developing adequate diagnostic capabilities for future computing and communications systems has been hampered by the lack of an adequate technological basis. Over the past decade, researchers within the artificial intelligence community have developed model-based diagnostic reasoning techniques. These techniques have the potential to provide comprehensive diagnostic coverage and to automate the design analysis process. MITRE is developing a prototype of the Generic Model-based Diagnostic System (GMODS) that is able to use VHDL models of circuit structure and behavior to diagnose single and multiple points of failure within digital sequential circuits. We provide an overview of GMODS and discuss the remaining research issues that need to be addressed before model-based reasoning systems such as GMODS will be of general utility to the R&M community. We also explore three potential system-level application areas-design analysis, depot-level diagnostics, and embedded diagnostics. We conclude that design analysis and depot-level diagnostics represent the most promising applications during the next few years
Keywords :
circuit analysis computing; diagnostic expert systems; failure analysis; model-based reasoning; specification languages; GMODS; Generic Model-based Diagnostic System; MITRE; VHDL models; artificial intelligence community; circuit structure; constraint propagation; depot-level diagnostics; design analysis; design analysis process; digital sequential circuits; embedded diagnostics; hardware description languages; model-based diagnostic reasoning; research issues; system-level applications; Application software; Circuit faults; Circuit synthesis; Circuit testing; Failure analysis; Fault diagnosis; Inference mechanisms; Process design; Sequential circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Computer-Aided Engineering in Concurrent Engineering, 1990 and 1991., Combined Proceedings of the 1990 and 1991 Leesburg Workshops on
Conference_Location :
Leesburg, VA ; Ellicott City, MD
Type :
conf
DOI :
10.1109/RMCAE.1992.245502
Filename :
245502
Link To Document :
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