Title :
QBIST: Quantum Built-in Self-Test for any Boolean Circuit
Author :
Chou, Yao-Hsin ; Kuo, Sy-Yen ; Tsai, I-Ming
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fDate :
April 27 2008-May 1 2008
Abstract :
A systematic procedure was proposed to derive a minimum space quantum circuit for any given classical logic with the generalized quantum Toffoli gate which is universal in Boolean logic. Since quantum computation is reversible, we can apply this property to build quantum iterative logic array (QILA). QILA can be easily tested in constant time (C-testable) if stuck-at fault model is assumed. In this paper, we use Hadamard and general CCN gates to make QILA 1-testable. That is, for any quantum Boolean circuit, the number of test patterns is independent of both the size of the array and the length of the inputs. This property can be applied to perform the quantum built-in self-test (QBIST), which makes any Boolean circuit 1-testable.
Keywords :
Boolean functions; built-in self test; quantum gates; Boolean circuit; Boolean logic; CCN gates; Hadamard; QBIST; generalized quantum Toffoli gate; minimum space quantum circuit; quantum built-in self-test; quantum computation; quantum iterative logic array; stuck-at fault model; Boolean functions; Built-in self-test; Circuit faults; Circuit testing; Electronic equipment testing; Logic arrays; Logic circuits; Logic testing; Quantum computing; Semiconductor device manufacture;
Conference_Titel :
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-0-7695-3123-6
DOI :
10.1109/VTS.2008.49