DocumentCode
3373401
Title
QBIST: Quantum Built-in Self-Test for any Boolean Circuit
Author
Chou, Yao-Hsin ; Kuo, Sy-Yen ; Tsai, I-Ming
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
April 27 2008-May 1 2008
Firstpage
261
Lastpage
266
Abstract
A systematic procedure was proposed to derive a minimum space quantum circuit for any given classical logic with the generalized quantum Toffoli gate which is universal in Boolean logic. Since quantum computation is reversible, we can apply this property to build quantum iterative logic array (QILA). QILA can be easily tested in constant time (C-testable) if stuck-at fault model is assumed. In this paper, we use Hadamard and general CCN gates to make QILA 1-testable. That is, for any quantum Boolean circuit, the number of test patterns is independent of both the size of the array and the length of the inputs. This property can be applied to perform the quantum built-in self-test (QBIST), which makes any Boolean circuit 1-testable.
Keywords
Boolean functions; built-in self test; quantum gates; Boolean circuit; Boolean logic; CCN gates; Hadamard; QBIST; generalized quantum Toffoli gate; minimum space quantum circuit; quantum built-in self-test; quantum computation; quantum iterative logic array; stuck-at fault model; Boolean functions; Built-in self-test; Circuit faults; Circuit testing; Electronic equipment testing; Logic arrays; Logic circuits; Logic testing; Quantum computing; Semiconductor device manufacture;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.49
Filename
4511733
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