• DocumentCode
    3373440
  • Title

    An oversampling 2D sigma-delta converter by cellular neural networks

  • Author

    Aomori, Hisashi ; Otake, Tsuyoshi ; Takahashi, Nobuaki ; Matsuda, Ichiro ; Itoh, Susumu ; Tanaka, Mamoru

  • Author_Institution
    Dept. of Electr. Eng., Tokyo Univ. of Sci., Noda, Japan
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    2566
  • Lastpage
    2569
  • Abstract
    The sigma-delta cellular neural network (SD-CNN) is a novel framework of spatial domain sigma-delta modulation utilizing neuro dynamics. Also, it has signal reconstruction and noise shaping characteristics that are important sigma-delta properties. Although the noise shaping effect with the oversampling technique plays very important role for drastic quantization noise reduction in binary digital sequences, the conventional SD-CNN could not use it effectively since it can be thought that the time-domain and spatial-domain oversampling are effective for the SD-CNN. In this paper, a novel SD-CNN with the oversampling technique for an analogue DC input is proposed. Experimental results of various standard test images in several oversampling ratios suggest that the proposed oversampling SD-CNN has an excellent AD and DA performance.
  • Keywords
    cellular neural nets; quantisation (signal); sigma-delta modulation; signal reconstruction; signal sampling; SD-CNN; binary digital sequences; cellular neural networks; neuro dynamics; noise shaping characteristics; noise shaping effect; oversampling 2D sigma-delta converter; oversampling technique; quantization noise reduction; sigma-delta cellular neural network; sigma-delta property; signal reconstruction; spatial domain sigma-delta modulation; spatial-domain oversampling; Cellular neural networks; Delta-sigma modulation; Frequency; Noise reduction; Noise shaping; Quantization; Sequences; Signal reconstruction; Testing; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537099
  • Filename
    5537099