DocumentCode :
3373524
Title :
Hydrogen Passivation of Boron Acceptors and Long-Term Breakdown Voltage Instability in N/sup +//P Su
Author :
Ciappa, Mauro ; Malberti, Paolo ; Birolini, Alessandro
fYear :
1996
fDate :
April 30 1996-May 2 1996
Firstpage :
327
Keywords :
Boron; Failure analysis; Hydrogen; Mass spectroscopy; Passivation; Plasma temperature; Schottky diodes; Semiconductor diodes; Semiconductor materials; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-2753-5
Type :
conf
DOI :
10.1109/RELPHY.1996.492138
Filename :
492138
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3373524
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