Title :
Shifting time waveform induced CMOS latch up in bootstrapping technique applications
Author :
Purwadi ; Bai, Shu-Ming ; Prabowo, Briliant Adhi ; Tsai, Jung-Ruey ; Sheu, Gene
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Asia Univ., Taichung, Taiwan
Abstract :
In this study, latch-up mechanisms of the complementary-metal-oxide-semiconductor (CMOS) in bootstrapping technique applied to DC/DC buck converter circuit has been clearly investigated by two dimensional (2D) TCAD simulations. The shifting times of input signal waveforms were demonstrated to be the key factor to induce the CMOS latch-up due to the triggering of parasitic bipolar junction transistors (BJTs) in the CMOS bootstrapping application. In addition, the free latch-up design window suggests that both of the larger rise time and longer shifting times of input signal waveforms will provide a larger safety operation region for circuit design engineers in this work.
Keywords :
CMOS logic circuits; DC-DC power convertors; bipolar transistors; bootstrap circuits; flip-flops; logic design; technology CAD (electronics); 2D TCAD simulations; BJT; CMOS bootstrapping application; CMOS latch up; DC/DC buck converter circuit; bootstrapping technique applications; circuit design engineers; complementary-metal-oxide-semiconductor; free latch-up design window; input signal waveforms; latch-up mechanisms; parasitic bipolar junction transistors; safety operation region; shifting time waveform; shifting times; CMOS integrated circuits; CMOS technology; Integrated circuit modeling; Latches; Reliability; Semiconductor device modeling; Transistors; Bootstrapping; CMOS; Latch-up; Shifting time waveform; TCAD;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-0980-6
DOI :
10.1109/IPFA.2012.6306305