DocumentCode
3373568
Title
Expanded Definition of Functional Operation Conditions and its Effects on the Computation of Functional Broadside Tests
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
fYear
2008
fDate
April 27 2008-May 1 2008
Firstpage
317
Lastpage
322
Abstract
Functional operation of a synchronous sequential circuit is defined to start after the circuit is initialized to a known state, typically by a synchronizing sequence. The states that the circuit can visit after it is synchronized are called reachable states, and functional operation consists of state-transitions between reachable states. We expand the definition of functional operation to include all the state-transitions that may be traversed during the application of the synchronizing sequence. This adds certain state-transitions that involve unreachable states to the definition of functional operation. Expanding the definition of functional operation is justified by the fact that the circuit needs to be designed for correct operation during the synchronization process. It is advantageous when functional broadside tests are used to avoid over- testing. We study the effect of the expanded definition on the coverage of transition faults.
Keywords
circuit testing; sequential circuits; functional broadside tests; functional operation conditions; synchronous sequential circuit; Circuit faults; Circuit testing; Cities and towns; Fault diagnosis; Hardware; Sequential circuits; Very large scale integration; full-scan circuits; functional broadside tests; reachable states; test generation; transition faults.;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.11
Filename
4511743
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