DocumentCode
3373607
Title
High Temperature I/sub DDQ/ Testing for Detection of Sodium and Potassium
Author
Sabin, Edwin
fYear
1996
fDate
April 30 1996-May 2 1996
Firstpage
355
Keywords
Atherosclerosis; BiCMOS integrated circuits; Contamination; Performance evaluation; Pollution measurement; Power measurement; Probes; Silicon; System testing; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location
Dallas, TX, USA
Print_ISBN
0-7803-2753-5
Type
conf
DOI
10.1109/RELPHY.1996.492142
Filename
492142
Link To Document