DocumentCode :
3373633
Title :
A High-Sensitivity Photon Emission Microscope System with Continuous Wavelength Spectroscopic Capabi
Author :
Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
fYear :
1996
fDate :
April 30 1996-May 2 1996
Firstpage :
360
Keywords :
Failure analysis; Optical coupling; Optical filters; Optical imaging; Optical microscopy; Optical sensors; Photonic integrated circuits; Spectral analysis; Spectroscopy; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-2753-5
Type :
conf
DOI :
10.1109/RELPHY.1996.492143
Filename :
492143
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3373633
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