• DocumentCode
    3373658
  • Title

    Error related factors in CT dimensional metrology

  • Author

    Lu, Hang

  • Author_Institution
    Sch. of Mech., Electron. & Control Eng., Beijing Jiaotong Univ., Beijing, China
  • fYear
    2011
  • fDate
    1-3 Nov. 2011
  • Firstpage
    175
  • Lastpage
    178
  • Abstract
    Since its invention in the early 1970´s, computed tomography (CT) has played a vital role for both medical and material inspection applications. More recently, CT has entered the domain of dimensional metrology, facilitating the measurement of interior structures. This paper concentrates on the assessment of CT measurement accuracy by investigating a series of influencing factors, such as the size of work pieces as well as the influence of surrounding material. In addition, the paper discusses grey value profiles of experiments that were designed to investigate the possibility to create a calibration database as a strategy to improve the measurement accuracy. Finally, the paper describes the influence of the reconstruction software settings on the CT accuracy.
  • Keywords
    calibration; computerised instrumentation; spatial variables measurement; CT dimensional metrology; CT measurement accuracy; calibration database; computed tomography; grey value profiles; interior structure measurement; material inspection applications; medical applications; reconstruction software settings; Accuracy; Computed tomography; Measurement uncertainty; Plastics; Steel; Thickness measurement; CT dimensional metrology; Grey value; Penetration depth; Threshold of edge determination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8265-8
  • Type

    conf

  • DOI
    10.1109/MAPE.2011.6156308
  • Filename
    6156308