DocumentCode :
3373687
Title :
1994 paper awards - Best Paper Award
fYear :
1996
fDate :
April 30 1996-May 2 1996
Firstpage :
391
Abstract :
The 1994 Best Paper Award was presented to Edward I. Cole Jr., Jerry M. Soden, James L. Rife, Daniel L. Barton, and Christopher L. Henderson for their article "Novel Failure Analysis Techniques Using Photon Probing With a Scanning Optical Microscope."
Keywords :
Awards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-2753-5
Type :
conf
DOI :
10.1109/RELPHY.1996.492145
Filename :
492145
Link To Document :
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