DocumentCode

3373715

Title

IP Session 11C: New Emerging Practices for Semiconductor Test

fYear

2008

fDate

April 27 2008-May 1 2008

Firstpage

360

Lastpage

360

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2008. VTS 2008. 26th IEEE

Conference_Location

San Diego, CA, USA

ISSN

1093-0167

Print_ISBN

978-0-7695-3123-6

Type

conf

DOI

10.1109/VTS.2008.80

Filename

4511751