• DocumentCode
    3373816
  • Title

    Improving yield learning by rapid electrical fault inspection and localization

  • Author

    Kim, Beomjun ; Hong, Jongtaek ; Han, Yongwoon ; Kapilevich, Izak ; Block, Jeff ; Lundquist, Ted ; Kim, Myung Hwan

  • Author_Institution
    Samsung Electron., Yongin, South Korea
  • fYear
    2012
  • fDate
    2-6 July 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    From wafer sort to yield learning is a long, complex process. Even worst because when scan chains fail, wafer sort adds negligible value. To address this gap a fast, reliable and accurate localization technology for scan chain fails that enable rapid translation of these into yield learning is presented.
  • Keywords
    electrical faults; fault diagnosis; integrated circuit reliability; rapid electrical fault inspection; rapid electrical fault localization; wafer sort; yield learning; Design automation; Frequency modulation; Lasers; Logic testing; Pins; Probes; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the
  • Conference_Location
    Singapore
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4673-0980-6
  • Type

    conf

  • DOI
    10.1109/IPFA.2012.6306319
  • Filename
    6306319
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3373816