مرکز منطقه ای اطلاع رساني علوم و فناوري - Special Session 13A: Panel : Mitigating Reliability, Yield and Power Issues in Nano-CMOS: Design Problem or EDA Problem?

DocumentCode :

3373847

Title :

Special Session 13A: Panel : Mitigating Reliability, Yield and Power Issues in Nano-CMOS: Design Problem or EDA Problem?

fYear :

2008

fDate :

April 27 2008-May 1 2008

Firstpage :

407

Lastpage :

407

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium, 2008. VTS 2008. 26th IEEE

Conference_Location :

San Diego, CA, USA

ISSN :

1093-0167

Print_ISBN :

978-0-7695-3123-6

Type :

conf

DOI :

10.1109/VTS.2008.82

Filename :

4511759

Link To Document :