DocumentCode
3373902
Title
Author index
fYear
2008
fDate
April 27 2008-May 1 2008
Firstpage
411
Lastpage
412
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE
Conference_Location
San Diego, CA
ISSN
1093-0167
Print_ISBN
978-0-7695-3123-6
Type
conf
DOI
10.1109/VTS.2008.63
Filename
4511762
Link To Document