Title :
High frequency test structures definition for electromagnetic coupling study between two symmetrical inductors. Electrical modelling of the whole coupling between coils
Author :
Clement, C. ; Van Haaren, B. ; Gloria, D.
Author_Institution :
Central R&D, ST Microelectron., Crolles, France
Abstract :
High frequency test structures for electromagnetic coupling study between two symmetrical inductors are described. Results from the S12 parameter measurement are compared to HP-Momentum electromagnetic (EM) simulations and show that coupling doesn´t reach -25dB and is smaller than -40dB for a separation distance between coils higher than 200μm. An electrical modelling of the whole coupling between coils is proposed and compared with experimental results.
Keywords :
S-parameters; coils; electromagnetic coupling; inductors; HPMomentum electromagnetic simulation; S-parameter measurement; coil; electrical model; electromagnetic coupling; high-frequency test structure; symmetrical inductors; BiCMOS integrated circuits; Coils; Coupling circuits; Cutoff frequency; Electromagnetic coupling; Electromagnetic measurements; Frequency measurement; Inductors; Q factor; Testing;
Conference_Titel :
Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on
Print_ISBN :
0-7803-7464-9
DOI :
10.1109/ICMTS.2002.1193166
