Title :
Session TB4: System-On-Chip (SOC) Integrated Circuits - Design and Test
Abstract :
Start of the above-titled section of the conference proceedings record.
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604122
