Title :
Electromagnetic pulse threats to electronic information system and corresponding protection measures
Author :
Zheng, Sheng-quan ; Hou, Dong-yun ; Liu, Qi-Feng ; Deng, Feng
Author_Institution :
Sci. & Technol. on Electromagn. Compatibility Lab., Wuhan, China
Abstract :
Electromagnetic pulse (EMP) radiation shall seriously disturb electronic information system. The EMP energy coupled from different approaches can even destroy semiconductor elements inside the equipment, make the system to function improperly. Several expressions of minatory EMP are investigated in this paper. The coupling characteristics and threat mechanism of EMP radiation entering into electronic information system are analyzed, and the EMP protection design methods for electronic information system are proposed in this paper.
Keywords :
electromagnetic coupling; electromagnetic pulse; information systems; EMP energy; EMP protection design methods; EMP radiation; coupling characteristics; electromagnetic pulse radiation; electromagnetic pulse threats; electronic information system; minatory EMP; protection measures; semiconductor elements; threat mechanism; coupling; electromagnetic pulse; protection; threat;
Conference_Titel :
Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8265-8
DOI :
10.1109/MAPE.2011.6156327