DocumentCode
3374024
Title
Electromagnetic pulse threats to electronic information system and corresponding protection measures
Author
Zheng, Sheng-quan ; Hou, Dong-yun ; Liu, Qi-Feng ; Deng, Feng
Author_Institution
Sci. & Technol. on Electromagn. Compatibility Lab., Wuhan, China
fYear
2011
fDate
1-3 Nov. 2011
Abstract
Electromagnetic pulse (EMP) radiation shall seriously disturb electronic information system. The EMP energy coupled from different approaches can even destroy semiconductor elements inside the equipment, make the system to function improperly. Several expressions of minatory EMP are investigated in this paper. The coupling characteristics and threat mechanism of EMP radiation entering into electronic information system are analyzed, and the EMP protection design methods for electronic information system are proposed in this paper.
Keywords
electromagnetic coupling; electromagnetic pulse; information systems; EMP energy; EMP protection design methods; EMP radiation; coupling characteristics; electromagnetic pulse radiation; electromagnetic pulse threats; electronic information system; minatory EMP; protection measures; semiconductor elements; threat mechanism; coupling; electromagnetic pulse; protection; threat;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-8265-8
Type
conf
DOI
10.1109/MAPE.2011.6156327
Filename
6156327
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