• DocumentCode
    3374024
  • Title

    Electromagnetic pulse threats to electronic information system and corresponding protection measures

  • Author

    Zheng, Sheng-quan ; Hou, Dong-yun ; Liu, Qi-Feng ; Deng, Feng

  • Author_Institution
    Sci. & Technol. on Electromagn. Compatibility Lab., Wuhan, China
  • fYear
    2011
  • fDate
    1-3 Nov. 2011
  • Abstract
    Electromagnetic pulse (EMP) radiation shall seriously disturb electronic information system. The EMP energy coupled from different approaches can even destroy semiconductor elements inside the equipment, make the system to function improperly. Several expressions of minatory EMP are investigated in this paper. The coupling characteristics and threat mechanism of EMP radiation entering into electronic information system are analyzed, and the EMP protection design methods for electronic information system are proposed in this paper.
  • Keywords
    electromagnetic coupling; electromagnetic pulse; information systems; EMP energy; EMP protection design methods; EMP radiation; coupling characteristics; electromagnetic pulse radiation; electromagnetic pulse threats; electronic information system; minatory EMP; protection measures; semiconductor elements; threat mechanism; coupling; electromagnetic pulse; protection; threat;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave, Antenna, Propagation, and EMC Technologies for Wireless Communications (MAPE), 2011 IEEE 4th International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-8265-8
  • Type

    conf

  • DOI
    10.1109/MAPE.2011.6156327
  • Filename
    6156327