Title :
Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors
Author :
Nenadovic, N. ; Nanver, L.K. ; Schellevis, H. ; de Mooij, D. ; Zieren, V. ; Slotboom, J.W.
Author_Institution :
Lab. of ECTM, Delft Univ. of Technol., Netherlands
Abstract :
A sensitive measurement method is used to discern between the thermal effects of very small changes in device surroundings and to extract high thermal resistance values. The description of electro-thermal behavior is complemented by nematic liquid crystal imaging and FEM simulations of the heat spreading around the device.
Keywords :
bipolar transistors; finite element analysis; semiconductor device measurement; thermal resistance measurement; FEM simulation; bipolar transistor; electro-thermal characteristics; heat spreading; nematic liquid crystal imaging; thermal resistance measurement; Bipolar transistors; Electrical resistance measurement; Electronic packaging thermal management; Heat sinks; Integrated circuit interconnections; Laboratories; Liquid crystal devices; Resistance heating; Temperature sensors; Thermal resistance;
Conference_Titel :
Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on
Print_ISBN :
0-7803-7464-9
DOI :
10.1109/ICMTS.2002.1193175
