• DocumentCode
    3374141
  • Title

    Si Memristive devices applied to memory and neuromorphic circuits

  • Author

    Jo, Sung Hyun ; Kim, Kuk-Hwan ; Chang, Ting ; Gaba, Siddharth ; Lu, Wei

  • Author_Institution
    Electr. Eng. & Comput. Sci., Univ. of Michigan - Ann Arbor, Ann Arbor, MI, USA
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    13
  • Lastpage
    16
  • Abstract
    We report studies on nanoscale Si-based memristive devices for memory and neuromorphic applications. The devices are based on ion motion inside an insulating a-Si matrix. Digital devices show excellent performance metrics including scalability, speed, ON/OFF ratio, endurance and retention. High density non-volatile memory arrays based on a crossbar structure have been fabricated and tested. Devices inside a 1kb array can be individually addressed with excellent reproducibility and reliability. By adjusting the device and material structures, nanoscale analog memristor devices have also been demonstrated. The analog memristor devices exhibit incremental conductance changes that are controlled by the charge flown through the device. The performances of the digital and analog devices are thought to be determined by the formation of a dominant conducting filament and the continuous motion of a uniform conduction front, respectively.
  • Keywords
    elemental semiconductors; memristors; random-access storage; silicon; Si; high density nonvolatile memory arrays; insulating a-Si matrix; ion motion; memory circuits; memristive devices; neuromorphic circuits; Circuits; Insulation; Measurement; Memristors; Nanoscale devices; Neuromorphics; Nonvolatile memory; Reproducibility of results; Scalability; Testing; crossbar; memristor; neuromorphic circuit; non-volatile memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537135
  • Filename
    5537135