Improved Free-Space S-Parameter Calibration

Author

Bartley, Philip G., Jr. ; Begley, Shelley B.

Author_Institution

Innovative Meas. Solutions, Inc., Portsmouth, VA

Volume

1

fYear

2005

fDate

16-19 May 2005

Firstpage

372

Lastpage

375

Abstract

An improved method for performing a full two-port s-parameter calibration in free-space is presented. The proposed calibration technique computes the error coefficients from measurements made on an empty fixture and a measurement made on a metal plate of known thickness. Time-domain gating was employed. This technique requires fewer and simpler standards than the existing TRL and TRM calibration techniques. Permittivity calculated from measurements, calibrated using this technique, made on a material sample appear to be superior to results published using the TRL and TRM calibration technique

Keywords

S-parameters; calibration; microwave measurement; network analysers; two-port networks; TRL calibration technique; TRM calibration technique; dielectric measurement; free-space calibration; metal plate; network analyzer calibration; permittivity measurement; s-parameter calibration; time domain gating; Antenna measurements; Calibration; Dielectric materials; Dielectric measurements; Electromagnetic measurements; Fixtures; Knowledge engineering; Permittivity measurement; Scattering parameters; Transmission line measurements; Network analyzer calibration; calibration; dielectric; free-space measurements; material measurement; permittivity; s-parameters; time domain gating;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE

Conference_Location

Ottawa, Ont.

Print_ISBN

0-7803-8879-8

Type

conf

DOI

10.1109/IMTC.2005.1604138

Filename

1604138