DocumentCode :
3374508
Title :
Spectral un-mixing of natural surfaces scenarios
Author :
Ekaterina, Carmina ; Véronique, Carrère
Author_Institution :
Lab. de Planetologie et Geodynamique de Nantes, Univ. de Nantes, Nantes, France
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
4491
Lastpage :
4494
Abstract :
Natural geological surfaces may have various mineralogical compositions and physical properties. Surface reflectance spectra acquired by field spectrometers result generally of contributions from several end-members (various soil/rock types, different sizes, etc.). Most of the algorithms commonly available these days to access sub-pixel information deal with linear (or spatial) un-mixing. However, natural environments represent complex situations, combining linear and non-linear mixtures at various scales. At this stage, empirical investigations are best suited to try and better understand the result of mixtures on spectral reflectance of natural surfaces. Surface spectral reflectance was acquired with an ASD FieldSpec spectrometer, covering the 0.4-2.5 μm range with a spectral resolution of 1 nm. A linear un-mixing algorithm was applied to several cases, then end-member abundances were estimated and compared to real abundances. Results showed non-ability of linear un-mixing to predict correct abundances of some end-members. This derives from non-linear contribution of some components of the mixture.
Keywords :
geochemistry; geology; geophysical signal processing; geophysical techniques; reflectivity; remote sensing; rocks; soil; ASD FieldSpec spectrometer; field spectrometers; linear unmixing algorithm; mineralogical compositions; natural geological surfaces; natural surfaces scenarios; rock type; soil type; spectral unmixing; subpixel information; surface reflectance spectra; Absorption; Grain size; Iron; Minerals; Reflectivity; Remote sensing; Spectral un-mixing; minerals; reflectance spectra; rocks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
2153-6996
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2010.5654020
Filename :
5654020
Link To Document :
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