Probing the Adhesion and Viability of Individual Cells with Field-Effect Transistors

Author

Ingebrandt, S. ; Wrobel, G. ; Eick, S. ; Schäfer, S. ; Offenhäusser, A.

Author_Institution

Inst. of Bio- & Nanosystems (IBN-2) & CNI - Center of Nanoelectronic Syst. for Inf., Julich

fYear

2007

fDate

10-14 June 2007

Firstpage

803

Lastpage

806

Abstract

We describe a novel method for the non-invasive, electronic monitoring of the cell-substrate adhesion. We utilize open-gate field-effect transistor (FET) chips for our adhesion measurements. These chips were developed, fabricated, and previously used for the extracellular recording from electrogenic cells. We developed a miniaturized and portable 16-channel amplifier system, which monitors the electronic transfer function of the FETs. We present cellular adhesion measurements of HEK 293 cells on an individual cell level. The system can additionally be used to probe the viability of individual cells.

Keywords

adhesion; biomedical measurement; biosensors; cellular biophysics; field effect transistors; 16-channel amplifier system; HEK 293 cells; cell-substrate adhesion; cellular adhesion measurements; electrogenic cells; electronic transfer function; extracellular recording; individual cell level; noninvasive electronic monitoring; open-gate field-effect transistor chips; single-cell bioassay; Actuators; Adhesives; Electrodes; Extracellular; FETs; Impedance measurement; Semiconductor device measurement; Solid state circuits; Transfer functions; Voltage; Cell-Substrate Adhesion; Field-Effect Transistor; Single-Cell Bioassay;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International

Conference_Location

Lyon

Print_ISBN

1-4244-0842-3

Electronic_ISBN

1-4244-0842-3

Type

conf

DOI

10.1109/SENSOR.2007.4300252

Filename

4300252