• DocumentCode
    3374646
  • Title

    Design and implementation of a time-division multiplexing scan architecture using serializer and deserializer in GPU chips

  • Author

    Sanghani, Amit ; Yang, Bo ; Natarajan, Karthikeyan ; Liu, Chunsheng

  • Author_Institution
    DFT Eng., NVIDIA Corp., Santa Clara, CA, USA
  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    219
  • Lastpage
    224
  • Abstract
    We present the design and implementation details of a time-division demultiplexing/multiplexing based scan architecture using serializer/deserializer. This is one of the key DFT features implemented on NVIDIA´s Fermi family GPU (Graphic Processing Unit) chips. We provide a comprehensive description on the architecture and specifications. We also depict a compact serializer/deserializer module design, test timing consideration, design rule and test pattern verification. Finally, we show silicon data collected from Fermi GPUs.
  • Keywords
    automatic test pattern generation; design for testability; graphical user interfaces; integrated circuit testing; microprocessor chips; time division multiplexing; GPU chips; NVIDIA´s Fermi family GPU; compact serializer/deserializer module design; design-for-test; graphic processing unit; key DFT features; test pattern verification; test timing consideration; time-division demultiplexing/multiplexing; time-division multiplexing scan architecture; Automatic test pattern generation; Clocks; Graphics processing unit; Multiplexing; Pipelines; Silicon; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783724
  • Filename
    5783724