DocumentCode
3374646
Title
Design and implementation of a time-division multiplexing scan architecture using serializer and deserializer in GPU chips
Author
Sanghani, Amit ; Yang, Bo ; Natarajan, Karthikeyan ; Liu, Chunsheng
Author_Institution
DFT Eng., NVIDIA Corp., Santa Clara, CA, USA
fYear
2011
fDate
1-5 May 2011
Firstpage
219
Lastpage
224
Abstract
We present the design and implementation details of a time-division demultiplexing/multiplexing based scan architecture using serializer/deserializer. This is one of the key DFT features implemented on NVIDIA´s Fermi family GPU (Graphic Processing Unit) chips. We provide a comprehensive description on the architecture and specifications. We also depict a compact serializer/deserializer module design, test timing consideration, design rule and test pattern verification. Finally, we show silicon data collected from Fermi GPUs.
Keywords
automatic test pattern generation; design for testability; graphical user interfaces; integrated circuit testing; microprocessor chips; time division multiplexing; GPU chips; NVIDIA´s Fermi family GPU; compact serializer/deserializer module design; design-for-test; graphic processing unit; key DFT features; test pattern verification; test timing consideration; time-division demultiplexing/multiplexing; time-division multiplexing scan architecture; Automatic test pattern generation; Clocks; Graphics processing unit; Multiplexing; Pipelines; Silicon; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
978-1-61284-657-6
Type
conf
DOI
10.1109/VTS.2011.5783724
Filename
5783724
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