Title :
Determination of thickness and dielectric constant of coatings from capacitance measurements
Author :
Guadanama-Santana, A. ; Valenzuela, A. Garcia
Author_Institution :
Centro de Ciencias Aplicadas y Desarrollo Tecnologico, Univ. Nacional Autonoma de Mexico, Coyoacan
Abstract :
We show it is possible to measure both the dielectric constant and thickness of dielectric coating on a flat conducting substrate from two capacitance measurements. We discuss the principles of measurement, present numerical simulations, and a proof of principle experiment
Keywords :
capacitance measurement; dielectric materials; permittivity measurement; thickness measurement; capacitance measurements; dielectric coating; dielectric constant determination; flat conducting substrate; thickness determination; Capacitance measurement; Coatings; Dielectric constant; Dielectric measurements; Thickness measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604163
