• DocumentCode
    3374660
  • Title

    A comparison of extraction techniques for threshold voltage mismatch

  • Author

    Croon, J.A. ; Tuinhout, H.P. ; Difrenza, R. ; Knol, J. ; Moonen, A.J. ; Decoutere, S. ; Maes, H.E. ; Sansen, W.

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2002
  • fDate
    8-11 April 2002
  • Firstpage
    235
  • Lastpage
    240
  • Abstract
    In this paper commonly used extraction methods of MOSFET threshold voltage mismatch are compared. The VT mismatch is extracted on the exact same device population by four independent characterization groups. Significant differences are observed, which are caused by differences in measurement setup and differences in extraction algorithm. The observed differences are analyzed. In addition merits and limitations of the various techniques are evaluated.
  • Keywords
    CMOS integrated circuits; MOSFET; integrated circuit testing; MOSFET threshold voltage; extraction techniques; measurement repeatability; threshold voltage mismatch; Analog circuits; CMOS technology; MOSFET circuits; Measurement techniques; Microelectronics; Modems; Semiconductor device measurement; Semiconductor device modeling; Testing; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on
  • Print_ISBN
    0-7803-7464-9
  • Type

    conf

  • DOI
    10.1109/ICMTS.2002.1193202
  • Filename
    1193202
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3374660