DocumentCode
3374662
Title
Harmony Widget for X-free scan testing
Author
Bhavsar, Dilip K.
Author_Institution
Intel Corp., Hudson, MA, USA
fYear
2011
fDate
1-5 May 2011
Firstpage
225
Lastpage
228
Abstract
This paper presents a simple innovative Design for Test (DFT) solution for removing one of the major sources of Xs (unknown outputs) during scan testing. The DFT called Harmony Widget is inserted at state elements that a scan test may load with illegal or unspecified state thus causing circuit to misbehave or produce indeterminate or unknown outputs (Xs). The DFT used is far simpler than the current practice in industry and blends with the prevailing scan design methodologies.
Keywords
circuit testing; design for testability; logic testing; Harmony widget; X-free scan testing; circuit testing; design for test solution; Automatic test pattern generation; Decoding; Discrete Fourier transforms; Industries; Logic gates; Silicon; ATPG; Conention-Free ATPG; DFT; Scan; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location
Dana Point, CA
ISSN
1093-0167
Print_ISBN
978-1-61284-657-6
Type
conf
DOI
10.1109/VTS.2011.5783725
Filename
5783725
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