DocumentCode :
3374662
Title :
Harmony Widget for X-free scan testing
Author :
Bhavsar, Dilip K.
Author_Institution :
Intel Corp., Hudson, MA, USA
fYear :
2011
fDate :
1-5 May 2011
Firstpage :
225
Lastpage :
228
Abstract :
This paper presents a simple innovative Design for Test (DFT) solution for removing one of the major sources of Xs (unknown outputs) during scan testing. The DFT called Harmony Widget is inserted at state elements that a scan test may load with illegal or unspecified state thus causing circuit to misbehave or produce indeterminate or unknown outputs (Xs). The DFT used is far simpler than the current practice in industry and blends with the prevailing scan design methodologies.
Keywords :
circuit testing; design for testability; logic testing; Harmony widget; X-free scan testing; circuit testing; design for test solution; Automatic test pattern generation; Decoding; Discrete Fourier transforms; Industries; Logic gates; Silicon; ATPG; Conention-Free ATPG; DFT; Scan; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2011 IEEE 29th
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
978-1-61284-657-6
Type :
conf
DOI :
10.1109/VTS.2011.5783725
Filename :
5783725
Link To Document :
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