• DocumentCode
    3374662
  • Title

    Harmony Widget for X-free scan testing

  • Author

    Bhavsar, Dilip K.

  • Author_Institution
    Intel Corp., Hudson, MA, USA
  • fYear
    2011
  • fDate
    1-5 May 2011
  • Firstpage
    225
  • Lastpage
    228
  • Abstract
    This paper presents a simple innovative Design for Test (DFT) solution for removing one of the major sources of Xs (unknown outputs) during scan testing. The DFT called Harmony Widget is inserted at state elements that a scan test may load with illegal or unspecified state thus causing circuit to misbehave or produce indeterminate or unknown outputs (Xs). The DFT used is far simpler than the current practice in industry and blends with the prevailing scan design methodologies.
  • Keywords
    circuit testing; design for testability; logic testing; Harmony widget; X-free scan testing; circuit testing; design for test solution; Automatic test pattern generation; Decoding; Discrete Fourier transforms; Industries; Logic gates; Silicon; ATPG; Conention-Free ATPG; DFT; Scan; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2011 IEEE 29th
  • Conference_Location
    Dana Point, CA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-61284-657-6
  • Type

    conf

  • DOI
    10.1109/VTS.2011.5783725
  • Filename
    5783725