Title :
Analysis of power losses in MOSFET synchronous rectifiers by using their design parameters
Author_Institution :
Origin Electr. Co. Ltd., Tokyo, Japan
Abstract :
Power losses in MOSFET synchronous rectifiers are discussed. A simple analytical model which is physical and uses only the design parameters has been developed for analysis of capacitive losses in the vertical MOSFET. A criterion is proposed to evaluate the performance of MOSFET synchronous rectifiers with regard to power loss. By using the model and the criterion, the influences of scaling geometry and trench gate structure on the power losses are analyzed. The results show that, contrary to the conduction loss, the capacitive loss in the UMOSFET increases with scaling geometry. Fractional analysis of the power loss reveals that for the UMOSFET with lower blocking voltages, the reduction in power loss is limited by the capacitive loss instead of the conduction loss calculated from the ideal silicon limit
Keywords :
isolation technology; losses; power MOSFET; semiconductor device models; solid-state rectifiers; MOSFET synchronous rectifier design parameters; MOSFET synchronous rectifiers; Si; SiO2-Si; UMOSFET; analytical model; blocking voltage; capacitive losses; conduction loss; design parameters; fractional analysis; ideal silicon limit; power losses; scaling geometry; trench gate structure; vertical MOSFET; Analytical models; Capacitance; Geometry; MOSFET circuits; Performance loss; Power MOSFET; Rectifiers; Silicon; Solid modeling; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1998. ISPSD 98. Proceedings of the 10th International Symposium on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4752-8
DOI :
10.1109/ISPSD.1998.702710